[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Stability of PEEC models with respect to partial element accuracyEkman, J.; Antonini, G.; Orlandi, A.; Ruehli, A.E. · 2004