Variation of electronic structures of CeAl2 thin films with thickness studied by X-ray absorption near-edge structure spectroscopy
- 作者C.L. Dong; K. Asokan; C.L. Chang; C.L. Chen; P.C. Lee; P.C. Chen; Y.Y. Chen; J.F. Lee; J.-H. Guo
- 卷第152卷
- 印刷ISSN0368-2048
- 文件大小361.69KB
- 发表时间2006
- DOI10.1016/j.elspec.2006.01.004
- 页码1-5
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