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Structure of Carrot Defects in 4H-SiC Epilayers

Structure of Carrot Defects in 4H-SiC Epilayers

Zhang, X.; Ha, Seo Young; Benamara, M.; Skowronski, Marek; Sumakeris, Joseph J.; Ryu, Sei Hyung; Paisley, Michael J.; O'Loughlin, Michael J.
  • 期刊名称Materials Science Forum
  • 作者Zhang, X.; Ha, Seo Young; Benamara, M.; Skowronski, Marek; Sumakeris, Joseph J.; Ryu, Sei Hyung; Paisley, Michael J.; O'Loughlin, Michael J.
  • 电子ISSN1662-9752
  • 文件大小5758.32KB
  • 发表时间2006
  • DOI10.4028/www.scientific.net/MSF.527-529.327
  • 页码327-332
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