![[IEEE ASP-DAC 2005. Asia and South Pacific Design Automation Conference 2005 - Shanghai, China (18-21 Jan. 2005)] Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation Conference, 2005. - An improved test access mechanism structure and optimization technique in system-on-chip]()
[IEEE ASP-DAC 2005. Asia and South Pacific Design Automation Conference 2005 - Shanghai, China (18-21 Jan. 2005)] Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation Conference, 2005. - An improved test access mechanism structure and optimization technique in system-on-chipFeng Jianhua, ; Long Jieyi, ; Xu Wenhua, ; Ye Hongfei, · 2005