![[IEEE 2016 5th IIAI International Congress on Advanced Applied Informatics (IIAI-AAI) - Kumamoto, Japan (2016.7.10-2016.7.14)] 2016 5th IIAI International Congress on Advanced Applied Informatics (IIAI-AAI) - Bias Reduction of Abilities for Adaptive Online IRT Testing Systems]()
[IEEE 2016 5th IIAI International Congress on Advanced Applied Informatics (IIAI-AAI) - Kumamoto, Japan (2016.7.10-2016.7.14)] 2016 5th IIAI International Congress on Advanced Applied Informatics (IIAI-AAI) - Bias Reduction of Abilities for Adaptive Online IRT Testing SystemsSakumura, Takenori; Hirose, Hideo · 2016