![Nondestructive testing method for a new generation of electronics]()
Nondestructive testing method for a new generation of electronicsAzin, Anton; Zhukov, Andrey; Narikovich, Anton; Ponomarev, Sergey; Rikkonen, Sergey; Leitsin, Vladimir; Kopanitsa, N.O.; Ovsyannikova, T.Y.; Plevkov, V.S.; Klopotov, A.A.; Teplyakova, L.A.; Radchenko, P.A. · MATEC Web of Conferences · 2018