Ultrathin transition-metal oxide films: Thickness dependence of the electronic structure and local geometry in MnO
- 期刊名称Physical Review B
- 作者Nagel, Mathias; Biswas, Indro; Nagel, Peter; Pellegrin, Eric; Schuppler, Stefan; Peisert, Heiko; Chassé, Thomas
- 卷第75卷
- 期第19期
- 印刷ISSN1098-0121
- 电子ISSN1550-235X
- 文件大小385.41KB
- 发表时间2007-5-18
- DOI10.1103/PhysRevB.75.195426
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