![Grain Boundaries across Length Scales; Correlating SEM, Aberration-Corrected TEM Orientation Imaging and Nanospectroscopy]()
Grain Boundaries across Length Scales; Correlating SEM, Aberration-Corrected TEM Orientation Imaging and NanospectroscopyBowman, W. J.; Darbal, A.; Kelly, M.; Rohrer, G.S.; Hernandez, C.H.; McGuinness, K.; Crozier, P.A. · Microscopy and Microanalysis · 2015