Optimized pattern grading
Bye, Elizabeth; LaBat, Karen; McKinney, Ellen; Kim, Dong‐Eun
- 期刊名称International Journal of Clothing Science and Technology
- 作者Bye, Elizabeth; LaBat, Karen; McKinney, Ellen; Kim, Dong‐Eun
- 卷第20卷
- 期第2期
- 印刷ISSN0955-6222
- 文件大小203.03KB
- 发表时间2008-02-29
- DOI10.1108/09556220810850469
- 页码79-92