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[IEEE 2008 IEEE International SOI Conference - New Paltz, NY (2008.10.6-2008.10.9)] 2008 IEEE International SOI Conference - Double-Gate Sub-32nm CMOS SRAM current and voltage sense amplifiers, insensitive to process variations and transistor mismatch

[IEEE 2008 IEEE International SOI Conference - New Paltz, NY (2008.10.6-2008.10.9)] 2008 IEEE International SOI Conference - Double-Gate Sub-32nm CMOS SRAM current and voltage sense amplifiers, insensitive to process variations and transistor mismatch

Makosiej, Adam; Nasalski, Piotr; Giraud, Bastien; Vladimirescu, Andrei; Amara, Amara
  • 作者Makosiej, Adam; Nasalski, Piotr; Giraud, Bastien; Vladimirescu, Andrei; Amara, Amara
  • 文件大小838.37KB
  • 发表时间2008
  • DOI10.1109/soi.2008.4656295
  • 页码63-64
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