On-Chip Delay Measurement Based Response Analysis for Timing Characterization

• 作者Ramyanshu Datta; Antony Sebastine; Ashwin Raghunathan; Gary Carpenter; Kevin Nowka; Jacob A. Abraham
• 卷第26卷
• 期第6期
• 印刷ISSN0923-8174
• 电子ISSN1573-0727
• 文件大小467.75KB
• 发表时间2010-12
• DOI10.1007/s10836-010-5188-1
• 页码599-619