![SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Optics and Photonics for Information Processing IX - Measuring refractive index of glass by using two captures under speckle field illumination]()
SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Optics and Photonics for Information Processing IX - Measuring refractive index of glass by using two captures under speckle field illuminationAwwal, Abdul A. S.; Iftekharuddin, Khan M.; Matin, Mohammad A.; García Vázquez, Mireya; Márquez, Andrés; Guo, Changliang; Li, Dayan; Kelly, Damien P.; Sheridan, John T. · 2015