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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Optics and Photonics for Information Processing IX - Measuring refractive index of glass by using two captures under speckle field illumination

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Optics and Photonics for Information Processing IX - Measuring refractive index of glass by using two captures under speckle field illumination

Awwal, Abdul A. S.; Iftekharuddin, Khan M.; Matin, Mohammad A.; García Vázquez, Mireya; Márquez, Andrés; Guo, Changliang; Li, Dayan; Kelly, Damien P.; Sheridan, John T.
  • 作者Awwal, Abdul A. S.; Iftekharuddin, Khan M.; Matin, Mohammad A.; García Vázquez, Mireya; Márquez, Andrés; Guo, Changliang; Li, Dayan; Kelly, Damien P.; Sheridan, John T.
  • 卷第9598卷
  • 印刷ISSN0277-786X
  • 文件大小436.01KB
  • 发表时间2015
  • DOI10.1117/12.2186306
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