![[IEEE 2011 American Control Conference - San Francisco, CA (2011.6.29-2011.7.1)] Proceedings of the 2011 American Control Conference - Dependence of film surface roughness on surface migration and lattice size in thin film deposition]()
[IEEE 2011 American Control Conference - San Francisco, CA (2011.6.29-2011.7.1)] Proceedings of the 2011 American Control Conference - Dependence of film surface roughness on surface migration and lattice size in thin film depositionJianqiao Huang, ; Gangshi Hu, ; Orkoulas, Gerassimos; Christofides, Panagiotis D. · 2011