AIP Conference Proceedings [AIP APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY: Twenty-First International Conference - Fort Worth, Texas, (USA) (8–13 August 2010)] - Positron Annihilation Induced Auger Electron Spectroscopic Studies Of Reconstructed Semiconductor Surfaces

Fazleev, N. G.; Reed, J. A.; Starnes, S. G.; Weiss, A. H.; McDaniel, Floyd D.; Doyle, Barney L.

作者Fazleev, N. G.; Reed, J. A.; Starnes, S. G.; Weiss, A. H.; McDaniel, Floyd D.; Doyle, Barney L.
印刷ISSN0094-243X
文件大小467.94KB
发表时间2011
DOI10.1063/1.3586148
页码493-496

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