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[IEEE 2012 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT) - Singapore, Singapore (2012.11.21-2012.11.23)] 2012 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT) - On the choice of cascade de-embedding methods for on-wafer S-parameter measurement

[IEEE 2012 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT) - Singapore, Singapore (2012.11.21-2012.11.23)] 2012 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT) - On the choice of cascade de-embedding methods for on-wafer S-parameter measurement

Amakawa, S.; Takano, K.; Katayama, K.; Motoyoshi, M.; Yoshida, T.; Fujishima, M.
  • 作者Amakawa, S.; Takano, K.; Katayama, K.; Motoyoshi, M.; Yoshida, T.; Fujishima, M.
  • 文件大小314.52KB
  • 发表时间2012
  • DOI10.1109/RFIT.2012.6401638
  • 页码134-136
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