[IEEE 2012 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT) - Singapore, Singapore (2012.11.21-2012.11.23)] 2012 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT) - On the choice of cascade de-embedding methods for on-wafer S-parameter measurement
Amakawa, S.; Takano, K.; Katayama, K.; Motoyoshi, M.; Yoshida, T.; Fujishima, M.
作者Amakawa, S.; Takano, K.; Katayama, K.; Motoyoshi, M.; Yoshida, T.; Fujishima, M.