[Int. Test Conference International Test Conference - Washington, DC, USA (2-6 Oct. 1994)] Proceedings., International Test Conference - Reduced scan shift: a new testing method for sequential circuitsHigami, Y.; Kajihara, S.; Kinoshita, K. · 1994

[IEEE Comput. Soc. Press IEEE 3rd Asian Test Symposium (ATS) - Nara, Japan (15-17 Nov. 1994)] Proceedings of IEEE 3rd Asian Test Symposium (ATS) - A partial scan algorithm based on reduced scan shiftHigami, Y.; Kajihara, S.; Kinoshita, K. · 1994

[IEEE Comput. Soc. Press Fifth Asian Test Symposium (ATS'96) - Hsinchu, Taiwan (20-22 Nov. 1996)] Proceedings of the Fifth Asian Test Symposium (ATS'96) - Partially parallel scan chain for test length reduction by using retiming techniqueHigami, Y.; Kajihara, S.; Kinoshita, K. · 1996