Optimal Selection of Imperfect Tests for Fault Detection and Isolation
- 期刊名称IEEE Transactions on Systems, Man, and Cybernetics: Systems
- 作者Zhang, Shigang; Pattipati, Krishna R.; Hu, Zheng; Wen, Xisen
- 卷第43卷
- 期第6期
- 印刷ISSN2168-2216
- 电子ISSN2168-2232
- 文件大小1000.65KB
- 发表时间2013-11
- DOI10.1109/tsmc.2013.2244210
- 页码1370-1384
Transportation [Technology 2000 analysis and forecast]Bretz, E.A. · IEEE Spectrum · 2000
Speedy data backupsBretz, E.A. · IEEE Spectrum · 2004
How to make deregulation workSweet, W.; Bretz, E.A. · IEEE Spectrum · 2002
Toward carbon free energySweet, W.; Bretz, E.A. · IEEE Spectrum · 1999
One Europe, raring to goSweet, W.; Bretz, E.A. · IEEE Spectrum · 1998
UK privatizes air traffic controlBretz, E.A. · IEEE Spectrum · 2001
Putting humidity in its placeBretz, E.A. · IEEE Spectrum · 2003
When work is fun and gamesBretz, E.A. · IEEE Spectrum · 2002
Generation smartphoneSiewiorek, Dan · IEEE Spectrum · 2012
The truth about terahertzArmstrong, Carter · IEEE Spectrum · 2012
How RCA Lost the LC DGross, B. · IEEE Spectrum · 2012
Spectral lines: The bankers vs. technologyChristiansen, Donald · IEEE Spectrum · 1977
Networking assets [distributed generation]Sweet, W. · IEEE Spectrum · 2001
Top 10 tech cars [hybrid electric vehiclesVoelcker, J. · IEEE Spectrum · 2005
Countering IEDSZorpette, Glenn · IEEE Spectrum · 2008
Flexible AC transmissionHingorani, N.G. · IEEE Spectrum · 1993