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/Si(111): Thin-film characterization by high-resolution electron-energy-loss spectroscopyLiehr, M.; Thiry, P. A.; Pireaux, J. J.; Caudano, R. · Physical Review B · 1986
Characterization of insulators by high-resolution electron-energy-loss spectroscopy: Application of a surface-potential stabilization techniqueLiehr, M.; Thiry, P. A.; Pireaux, J. J.; Caudano, R. · Physical Review B · 1986
Formic acid on aluminum oxide: A comparison between inelastic-electron-tunneling spectroscopy and high-resolution electron-energy-loss spectroscopyLiehr, M.; Thiry, P. A.; Pireaux, J. J.; Caudano, R. · Physical Review B · 1985
Phonon frequencies of goldSingh, Natthi; Prakash, Satya · Physical Review B · 1974
Graphene nanoribbons subject to gentle bendsKoskinen, P. · Physical Review B · 2012
Topological p-n junctionWang, Jing; Chen, Xi; Zhu, Bang-Fen; Zhang, Shou-Cheng · Physical Review B · 2012
Nonlocal feedback in ferromagnetic resonanceBose, Thomas; Trimper, Steffen · Physical Review B · 2012
Dissipationless phonon Hall viscosityBarkeshli, Maissam; Chung, Suk Bum; Qi, Xiao-Liang · Physical Review B · 2012
Surface states of topological insulatorsZhang, Fan; Kane, C. L.; Mele, E. J. · Physical Review B · 2012
Graphene hyperlens for terahertz radiationAndryieuski, Andrei; Lavrinenko, Andrei V.; Chigrin, Dmitry N. · Physical Review B · 2012
Persistent current induced by quantum lightKibis, O. V. · Physical Review B · 2012