![AIP Conference Proceedings [AIP PROCEEDING OF INTERNATIONAL CONFERENCE ON RECENT TRENDS IN APPLIED PHYSICS AND MATERIAL SCIENCE: RAM 2013 - Bikaner, Rajasthan, India (1–2 February 2013)] - Determination of refractive index and thickness of thin-film from reflectivity spectrum using genetic algorithm]()
AIP Conference Proceedings [AIP PROCEEDING OF INTERNATIONAL CONFERENCE ON RECENT TRENDS IN APPLIED PHYSICS AND MATERIAL SCIENCE: RAM 2013 - Bikaner, Rajasthan, India (1–2 February 2013)] - Determination of refractive index and thickness of thin-film from reflectivity spectrum using genetic algorithmPatel, Sanjaykumar J.; Kheraj, Vipul · 2013