![[IEEE IEEE 14th Topical Meeting on Electrical Performance of Electronic Packaging, 2005. - Austin, TX, USA (Oct. 24-26, 2005)] IEEE 14th Topical Meeting on Electrical Performance of Electronic Packaging, 2005. - Fully integrated AC coupled interconnect using buried bumps]()
[IEEE IEEE 14th Topical Meeting on Electrical Performance of Electronic Packaging, 2005. - Austin, TX, USA (Oct. 24-26, 2005)] IEEE 14th Topical Meeting on Electrical Performance of Electronic Packaging, 2005. - Fully integrated AC coupled interconnect using buried bumpsWilson, J.; Mick, S.; Jian Xu, ; Lei Luo, ; Bonafede, S.; Huffman, A.; LaBennett, R.; Franzon, P. · 2005