![[IEEE 2004 International Semiconductor Conference. CAS 2004 - Sinaia, Romania (4-6 Oct. 2004)] 2004 International Semiconductor Conference. CAS 2004 Proceedings (IEEE Cat. No.04TH8748) - Screening the reliable semiconductor chips by laser acceleration of deep level recombination. Process certification for industrial application]()
[IEEE 2004 International Semiconductor Conference. CAS 2004 - Sinaia, Romania (4-6 Oct. 2004)] 2004 International Semiconductor Conference. CAS 2004 Proceedings (IEEE Cat. No.04TH8748) - Screening the reliable semiconductor chips by laser acceleration of deep level recombination. Process certification for industrial applicationGalateanu, L.; Bazu, M.; Ilian, V.; Tibeica, C.; Petu, A.; Apostol, D.; Damian, V. · 2004