Endurance behavior of conductive yarns
- 期刊名称Microelectronics Reliability
- 作者de Vries, Hans; Cherenack, Kunigunde H.
- 卷第54卷
- 期第1期
- 印刷ISSN0026-2714
- 文件大小946.46KB
- 发表时间2014-1
- DOI10.1016/j.microrel.2013.08.014
- 页码327-330
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