[IEEE Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings - Austin, TX, USA (5-7 March 1996)] Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings - Analysis of thermally-enhanced SOIC packagesGuenin, B.M.; Chowdhury, A.; Groover, R.; Derian, E.J. · 1996