[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Impact of ionic drift and vacancy defect passivation on TDDB statistics and lifetime enhancement of metal gate high-κ stacks
- 作者Raghavan, Nagarajan; Pey, Kin Leong; Frey, Daniel D.; Bosman, Michel
- 文件大小478.22KB
- 发表时间2014
- DOI10.1109/IRPS.2014.6860666
[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Biographies2014
[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - PrefaceChaparala, Prasad · 2014
[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Copyright page2014
[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Calendar notice2014
[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - 2014 IRPS tutorial program2014
[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Officers and committees2014
[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Board of directors2014
[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Technical program committee2014
Variability model for forming process in oxygen vacancy modulated high-κ based resistive switching memory devicesRaghavan, Nagarajan; Bosman, Michel; Frey, Daniel D.; Pey, Kin Leong · Microelectronics Reliability · 2014
Statistics of retention failure in the low resistance state for hafnium oxide RRAM using a Kinetic Monte Carlo approachRaghavan, Nagarajan; Frey, Daniel D.; Bosman, Michel; Pey, Kin Leong · Microelectronics Reliability · 2015
[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Stochastic failure model for endurance degradation in vacancy modulated HfO<inf>x</inf> RRAM using the percolation cell frameworkRaghavan, Nagarajan; Pey, Kin Leong; Frey, Daniel D.; Bosman, Michel · 2014