![[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - Deterministic test pattern reproduction by a counter]()
[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - Deterministic test pattern reproduction by a counterKagaris, D.; Tragoudas, S.; Majumdar, A. · 1996