Table of contents
- 期刊名称IEEE Transactions on Systems, Man, and Cybernetics: Systems
- 卷第44卷
- 期第1期
- 印刷ISSN2168-2216
- 电子ISSN2168-2232
- 文件大小38.60KB
- 发表时间2014-01
- DOI10.1109/tsmc.2013.2294247
MEMS Reliability ReviewHuang, Yunhan; Sai Sarathi Vasan, Arvind; Doraiswami, Ravi; Osterman, Michael; Pecht, Michael · IEEE Transactions on Device and Materials Reliability · 2012
The history of reliability predictionDenson, W. · IEEE Transactions on Reliability · 1998
IEEE code of ethicsIEEE Transactions on Reliability · 1984
Maintainability: A historical perspectiveRetterer, Bernard L.; Kowalski, Richard A. · IEEE Transactions on Reliability · 1984
Reliability education: A historical perspectiveKececioglu, Dimitri · IEEE Transactions on Reliability · 1984
Design for soft error mitigationNicolaidis, M. · IEEE Transactions on Device and Materials Reliability · 2005
Reliability Victory SongStewart, B. · IEEE Transactions on Reliability · 1998
Electronics reliability: a personal viewEvans, R.A. · IEEE Transactions on Reliability · 1998