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Electrical Modeling and Characterization of Shield Differential Through-Silicon Vias

Electrical Modeling and Characterization of Shield Differential Through-Silicon Vias

Lu, Qijun; Zhu, Zhangming; Yang, Yintang; Ding, Ruixue
  • 期刊名称IEEE Transactions on Electron Devices
  • 作者Lu, Qijun; Zhu, Zhangming; Yang, Yintang; Ding, Ruixue
  • 卷第62卷
  • 期第5期
  • 印刷ISSN0018-9383
  • 电子ISSN1557-9646
  • 文件大小2322.18KB
  • 发表时间2015-5
  • DOI10.1109/ted.2015.2410312
  • 页码1544-1552
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