![SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks - <title>Thermal modeling using enthalpy methods to aid in the study of microstructural changes of multilayered phase change optical memories</title>]()
SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks - <title>Thermal modeling using enthalpy methods to aid in the study of microstructural changes of multilayered phase change optical memories</title>Nagpal, Swati; Aurora, Aradhna; Podio, Fernando L. · 1999