EMC personality profile
- 期刊名称IEEE Electromagnetic Compatibility Magazine
- 作者Sabath, Frank
- 卷第4卷
- 期第3期
- 印刷ISSN2162-2264
- 电子ISSN2162-2272
- 文件大小1567.25KB
- 发表时间2015
- DOI10.1109/memc.2015.7336686
- 页码25-25
Digitally intensive wireless transceiversStaszewski, Robert Bogdan · IEEE Design & Test of Computers · 2012
Test Challenges for 3D Integrated CircuitsLee, Hsien-Hsin; Chakrabarty, Krishnendu · IEEE Design & Test · 2013
Adaptive Alternate Analog TestStratigopoulos, Haralampos-G.; Mir, Salvador · IEEE Design & Test of Computers · 2012
The Olympus synthesis systemDe Micheli, G.; Ku, D.; Mailhot, F.; Truong, T. · IEEE Design & Test of Computers · 1990
Clock system designWagner, K.D. · IEEE Design & Test of Computers · 1988
Alpha 21164 testability strategyBhavsar, D.K.; Edmondson, J.H. · IEEE Design & Test of Computers · 1997
Automatic generation of parallel CRC circuitsSprachmann, M. · IEEE Design & Test of Computers · 2001
Automated BIST for sequential logic synthesisStroud, C.E. · IEEE Design & Test of Computers · 1988