![[IEEE 2016 IEEE AUTOTESTCON - Anaheim, CA, USA (2016.9.12-2016.9.15)] 2016 IEEE AUTOTESTCON - Recommended practice for insuring reuse and integrity of ATS data by the application of IEEE SCC20/ATML standards]()
[IEEE 2016 IEEE AUTOTESTCON - Anaheim, CA, USA (2016.9.12-2016.9.15)] 2016 IEEE AUTOTESTCON - Recommended practice for insuring reuse and integrity of ATS data by the application of IEEE SCC20/ATML standardsModi, Mukund; Stanco, Joe; Verbovsky, Patrick · 2016