New Opportunities with Oval-shaped Silicon Drift Detectors for High-Throughput EDX Analysis in Electron MicroscopyNiculae, A.; Bechteler, A.; Eckhardt, R.; Hermenau, K.; Liebel, A.; Lutz, G.; Schöning, A.; Soltau, H.; Strüder, L. · Microscopy and Microanalysis · 2016

Image analysis and simulation software in transmission electron microscopyStadelmann, P · Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada · 2003

Surface Microanalysis with Slow ElectronsBauer, Ernst G. · Microscopy and Microanalysis · 2006

Scientific ProgramMicroscopy and Microanalysis · 2008

Nanogenerators and NanopiezotronicsWang, ZL · Microscopy and Microanalysis · 2009

Trichomonads under MicroscopyBenchimol, Marlene · Microscopy and Microanalysis · 2004

Electron Microscopic Studies with GrapheneMeyer, J; Chuvilin, A; Kaiser, U · Microscopy and Microanalysis · 2009

Stress Whitening Morphology of Multiphase PolypropyleneWestphal, S · Microscopy and Microanalysis · 2006

Aberration-Corrected Lorentz MicroscopyNuhfer, NT; Budruk, A; De Graef, M · Microscopy and Microanalysis · 2010