![[IEEE 2016 11th European Microwave Integrated Circuits Conference (EuMIC) - London, United Kingdom (2016.10.3-2016.10.4)] 2016 11th European Microwave Integrated Circuits Conference (EuMIC) - Linearity characterization of GaN HEMT technologies through innovative on-wafer multi-tone load-pull measurements]()
[IEEE 2016 11th European Microwave Integrated Circuits Conference (EuMIC) - London, United Kingdom (2016.10.3-2016.10.4)] 2016 11th European Microwave Integrated Circuits Conference (EuMIC) - Linearity characterization of GaN HEMT technologies through innovative on-wafer multi-tone load-pull measurementsKahil, Si Abed Karim; Laurent, Sylvain; Quere, Raymond; Sombrin, Jacques; Floriot, Didier; Brunel, Valeria; Teyssandier, Charles · 2016