[IEEE 2017 IEEE 35th VLSI Test Symposium (VTS) - Las Vegas, NV, USA (2017.4.9-2017.4.12)] 2017 IEEE 35th VLSI Test Symposium (VTS) - Innovative practices session 10B innovative practices in Asia-2: From cost perspective

• 作者Hatayama, Kazumi; Ishida, Masahiro
• 文件大小95.90KB
• 发表时间2017
• DOI10.1109/VTS.2017.7928957
• 页码1-1