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Inhomogeneous strain states in sputter deposited tungsten thin filmsI. C. Noyan; T. M. Shaw; C. C. Goldsmith · 1997
Thermal Stress Relaxation in Vapor Deposited Thin FilmsNoyan, I. C.; Goldsmith, C. C. · Advances in X-ray Analysis · 1990
Residual Stresses in MaterialsI. C. Noyan and J. B. Cohen · American Scientist · 1991
STRESS DETERMINATION IN SEMICONDUCTOR NANOSTRUCTURES USING X-RAY DIFFRACTIONC. E. Murray; I. C. Noyan · 2011
Thermal stress evolution in embedded Cu/low-k dielectric composite featuresC. E. Murray; C. C. Goldsmith; T. M. Shaw; J. P. Doyle; I. C. Noyan · 2006
Dynamical diffraction artifacts in Laue microdiffraction imagesYan, Hanfei; Noyan, I. C. · Journal of Applied Physics · 2005
Defining Residual Stresses in Thin Film StructuresNoyan, I. C. · Advances in X-ray Analysis · 1991
Temperature-dependent interatomic forcesSutton, A. P. · Philosophical Magazine A · 1989
Fundamentals of fractureRoberts, Steve · Philosophical Magazine A · 2002
Ion transport in ceramicsMatzke, Hj. · Philosophical Magazine A · 1991
Compression testing of quasicrystalline materialsKang, Song Seng; Dubois, Jean Marie · Philosophical Magazine A · 1992
Why diamond is very hardGilman, John J. · Philosophical Magazine A · 2002
Nucleation under time-dependent supersaturationTrinkaus, H.; Yoo, M. H. · Philosophical Magazine A · 1987
Local atomic arrangements in polytetrahedral materialsBorodin, V. A. · Philosophical Magazine A · 1999
The generalized Peierls–Nabarro modelSchoeck, G. · Philosophical Magazine A · 1994