![[IEEE 2015 IEEE International Conference on Data Mining (ICDM) - Atlantic City, NJ, USA (2015.11.14-2015.11.17)] 2015 IEEE International Conference on Data Mining - Forensic Style Analysis with Survival Trajectories]()
[IEEE 2015 IEEE International Conference on Data Mining (ICDM) - Atlantic City, NJ, USA (2015.11.14-2015.11.17)] 2015 IEEE International Conference on Data Mining - Forensic Style Analysis with Survival TrajectoriesYadav, Pranjul; Steinbach, Michael; Pruinelli, Lisiane; Westra, Bonnie; Delaney, Connie; Kumar, Vipin; Simon, Gyorgy · 2015