海量图书期刊资源,随时随地畅享阅读乐趣
Experimental study of pulse neutron irradiation damage in SiGe HBTLawal, Olarewaju Mubashiru; Li, Zhuoqi; Liu, Shuhuan; Hussain, Aqil; Yang, JiangKun; Zhao, Hongchao; Xiong, Cen · Journal of Nuclear Science and Technology · 2018
Experimental studies of collector-emitter voltage bias influence on the total ionization dose effects in NPN Si BJTsLawal, Olarewaju Mubashiru; Liu, Shuhuan; Li, Zhuoqi; Yang, JiangKun; Hussain, Aqil · Superlattices and Microstructures · 2018
Thermal heating within SOIKoning, J.J.; Lecaudey, S.; Spaan, E.; Stoutjesdijk, M.; Janssen, J.H.J. · Microelectronics Reliability · 2008
Inside front cover - Editorial boardMicroelectronics Reliability · 2008
RF CMOS reliability simulationsSasse, Guido T.; Acar, Mustafa; Kuper, Fred G.; Schmitz, Jurriaan · Microelectronics Reliability · 2008
EditorialGroeseneken, Guido; Wolf, Ingrid De; Mouthaan, Anton; Bisschop, Jaap · Microelectronics Reliability · 2008
Inside front cover - Editorial boardMicroelectronics Reliability · 2014
Book ReviewNaikan, Vallayil N.A. · Microelectronics Reliability · 2013
Endurance behavior of conductive yarnsde Vries, Hans; Cherenack, Kunigunde H. · Microelectronics Reliability · 2014
Trends in automotive power semiconductor packagingDietrich, Peter · Microelectronics Reliability · 2013