![Using MRED to Screen Multiple Node Charge Collection Mitigated SOI Layouts]()
Using MRED to Screen Multiple Node Charge Collection Mitigated SOI LayoutsBlack, Jeffrey D.; Dame, Jeff A.; Black, Dolores A.; Dodd, Paul E.; Shaneyfelt, Marty R.; Teifel, John; Salas, Joseph G.; Steinbach, Robert; Davis, Matthew; Reed, Robert A.; Weller, Robert A.; Trippe, James M.; Warren, Kevin M.; Tonigan, Andrew M.; Schrimpf, Ronald D.; Marquez, Richard S. · IEEE Transactions on Nuclear Science · 2018