[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Physical Insights into the Low Current ESD Failure of LDMOS-SCR and its Implication on Power Scalability
Karmel Kranthi, Nagothu; Sampath Kumar, B.; Salman, Akram; Boselli, Gianluca; Shrivastava, Mayank
- 作者Karmel Kranthi, Nagothu; Sampath Kumar, B.; Salman, Akram; Boselli, Gianluca; Shrivastava, Mayank
- 文件大小734.07KB
- 发表时间2019
- DOI10.1109/IRPS.2019.8720580
- 页码1-5