![SPIE Proceedings [SPIE Photonics Asia 2007 - Beijing, China (Sunday 11 November 2007)] Optical Design and Testing III - <title>The effect of beam incident angles on cube corner retro-reflector measuring accuracy</title>]()
SPIE Proceedings [SPIE Photonics Asia 2007 - Beijing, China (Sunday 11 November 2007)] Optical Design and Testing III - <title>The effect of beam incident angles on cube corner retro-reflector measuring accuracy</title>Ouyang, Jianfei; Liu, Wanli; Qu, Xinghua; Yan, Yonggang; Wang, Yongtian; Tschudi, Theo T.; Rolland, Jannick P.; Tatsuno, Kimio · 2007