![POST-ANNEALING EFFECTS ON THE STRUCTURAL, OPTICAL AND ELECTRICAL PROPERTIES OF ITO FILMS STUDIED BY SPECTROSCOPIC ELLIPSOMETRY]()
POST-ANNEALING EFFECTS ON THE STRUCTURAL, OPTICAL AND ELECTRICAL PROPERTIES OF ITO FILMS STUDIED BY SPECTROSCOPIC ELLIPSOMETRYINRITSAPONG, Y.; CHINDAUDOM, P.; NUNTAWONG, N.; PATTHANASETTHAKUL, V.; HORPHATHUM, M.; EIAMCHAI, P.; POKAIPISIT, A.; LIMSUWAN, P. · Modern Physics Letters B · 2010