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Through the Looking Glass -- The 2017 Edition: Trends in Solid-State Circuits from ISSCCDaly, Denis C.; Fujino, Laura C.; Smith, Kenneth C. · IEEE Solid-State Circuits Magazine · 2017
Through the Looking Glass - The 2018 Edition: Trends in Solid-State Circuits from the 65th ISSCCDaly, Denis C.; Fujino, Laura C.; Smith, Kenneth C. · IEEE Solid-State Circuits Magazine · 2018