![[IEEE 2015 19th International Symposium on VLSI Design and Test (VDAT) - Ahmedabad, India (2015.6.26-2015.6.29)] 2015 19th International Symposium on VLSI Design and Test - An impressive approach for incorporating parallelism in designing DMFB with cross contamination avoidance]()
[IEEE 2015 19th International Symposium on VLSI Design and Test (VDAT) - Ahmedabad, India (2015.6.26-2015.6.29)] 2015 19th International Symposium on VLSI Design and Test - An impressive approach for incorporating parallelism in designing DMFB with cross contamination avoidanceDhal, Debasis; Datta, Piyali; Chakrabarty, Arpan; Roy, Sudipta; Pal, Rajat Kumar · 2015