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[Series in Optics and Optoelectronics] Handbook of Silicon Photonics Volume 20130577 || Nonlinear Optics in SiliconVivien, Laurent; Pavesi, Lorenzo · 2013
[Series in Optics and Optoelectronics] Handbook of Silicon Photonics Volume 20130577 || PhotodetectorsVivien, Laurent; Pavesi, Lorenzo · 2013
[Series in Optics and Optoelectronics] Handbook of Silicon Photonics Volume 20130577 || IndexVivien, Laurent; Pavesi, Lorenzo · 2013
[Series in Optics and Optoelectronics] Handbook of Silicon Photonics Volume 20130577 || Optical ModulationVivien, Laurent; Pavesi, Lorenzo · 2013
[Series in Optics and Optoelectronics] Handbook of Silicon Photonics Volume 20130577 || Photonic CrystalsVivien, Laurent; Pavesi, Lorenzo · 2013
[Series in Optics and Optoelectronics] Handbook of Optical Dimensional Metrology Volume 20135538 || Portable MetrologyHarding, Kevin · 2013
[Series in Optics and Optoelectronics] Handbook of Silicon Photonics Volume 20130577 || Group IV MaterialsVivien, Laurent; Pavesi, Lorenzo · 2013
Practical Management of Congenital Choanal AtresiaTheogaraj, S. Dawson; Hoehn, James G.; Hagan, Kevin F.; Harding, Robert L.; Harding, Robert L. · Plastic and Reconstructive Surgery · 1983
Community pharmacists' role in public healthHarding, Geoff; Taylor, Kevin; Taylor, Kevin · Critical Public Health · 1994
SPIE Proceedings [SPIE Photonics Asia - Beijing, China (Monday 5 November 2012)] Optical Metrology and Inspection for Industrial Applications II - OCT for industrial applicationsSong, Guiju; Harding, Kevin; Harding, Kevin G.; Huang, Peisen S.; Yoshizawa, Toru · 2012
SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - 3D profilometry: next requests from the industrial viewpointHarding, Kevin; Harding, Kevin; Huang, Peisen S.; Yoshizawa, Toru · 2010
SPIE Proceedings [SPIE ICALEO89 - Orlando, United States (Tuesday 10 October 1989)] ICALEO '89: Optical Sensing and Measurement - <title>Current state-of-the-art of contouring techniques in manufacturing</title>Harding, Kevin G.; Harding, Kevin G. · 1990
SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - Phase shift based measurements using a pocket LCD projectorWilliams, Yana; Harding, Kevin; Huang, Peisen S.; Harding, Kevin; Yoshizawa, Toru · 2010
SPIE Proceedings [SPIE 1988 Dearborn Symposium - Dearborn, MI (Monday 27 June 1988)] Optomechanical and Electro-Optical Design of Industrial Systems - <title>Tolerance Design Of A High Precision Optical Gage</title>Harding, Kevin G.; Bieringer, Robert J.; Harding, Kevin G. · 1988
SPIE Proceedings [SPIE Optics East 2005 - Boston, MA (Sunday 23 October 2005)] Two- and Three-Dimensional Methods for Inspection and Metrology III - Latest optical methods for industrial dimensional metrologyHarding, Kevin; Harding, Kevin G. · 2005