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Nanospectroscopy Imaging Techniques: Using NSOM and TERS for Semiconductor Materials ImagingYin, Yu-Tung; Lin, Hung-Ming; Wang, Chia-Ching; Chou, Mei-Hua; Chou, Shih-Jie; Kuo, Yu-Shuan; Kim, DongHyun; Chen, Liang-Yih; Chen, Ching-Hsiang · IEEE Nanotechnology Magazine · 2017