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Techniques of Microprocessor Testing and SEU-Rate PredictionKoga, R.; Kolasinski, W. A.; Marra, M. T.; Hanna, W. A. · 1985
Correlated Proton and Heavy Ion Upset Measurements on IDT Static RAMsCampbell, A. B.; Stapor, W. J.; Koga, R.; Kolasinski, W. A. · 1985
Mechanisms Leading to Single Event UpsetAxness, C. L.; Weaver, H. T.; Fu, J. S.; Koga, R.; Kolasinski, W. A. · IEEE Transactions on Nuclear Science · 1986
Recent Trends in Parts SEU Susceptibility from Heavy IonsNichols, D. K.; Smith, L. S.; Price, W. E.; Koga, R.; Kolasinski, W. A. · IEEE Transactions on Nuclear Science · 1987
Comparison of 2D Memory SEU Transport Simulation with ExperimentsFu, J. S.; Weaver, H. T.; Koga, R.; Kolasinski, W. A. · 1985
Single Event Upset Rate Estimates for a 16-K CMOS SRAMBrowning, John S.; Koga, R.; Kolasinski, W. A. · 1985
Effects of Heavy Ions on Microcircuits in Space: Recently Investigated Upset MechanismsKoga, R.; Kolasinski, W. A. · 1987
Trends in Parts Susceptibility to Single Event Upset from Heavy IonsNichols, Donald K.; Price, William E.; Kolasinski, W. A.; Koga, R.; Pickel, James C.; Blandford, James T.; Waskiewicz, A. E. · 1985