![[IEEE 2009 17th IEEE International Requirements Engineering Conference (RE) - Atlanta, Georgia, USA (2009.08.31-2009.09.4)] 2009 17th IEEE International Requirements Engineering Conference - Looking for Product Line Feature Models Defects: Towards a Systematic Classification of Verification Criteria]()
[IEEE 2009 17th IEEE International Requirements Engineering Conference (RE) - Atlanta, Georgia, USA (2009.08.31-2009.09.4)] 2009 17th IEEE International Requirements Engineering Conference - Looking for Product Line Feature Models Defects: Towards a Systematic Classification of Verification CriteriaSalinesi, Camille; Rolland, Colette; Diaz, Daniel; Mazo, Raúl · 2009