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[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - A 15-valued fast test generation for combinational circuits

[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - A 15-valued fast test generation for combinational circuits

Hong, S.J.

作者Hong, S.J.
文件大小391.03KB
发表时间1993
DOI10.1109/ats.1993.398789
页码113-118

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