Characterization of the B/Si surface electronic structuresCao, R. · Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films · 1993

Characterization of the Pb1 Interface Defect in Thermal (100)Si/SiO2 by Electron Spin Resonance: 29Si Hyperfine Structure and Electrical RelevanceStesmans, A. L. · MRS Proceedings · 1999

Characterization of the electronic structure and thermal stability of HfO <sub/>2</sub> /SiO <sub/>2</sub> /Si gate dielectric stackDuan, T. L.; Pan, L.; Zhang, Z.; Tok, E. S.; Pan, J. S. · Surface and Interface Analysis · 2017

Structural characterization of amorphous ceramics in the system Si–B–N–(C) by means of transmission electron microscopy methodsHeinemann, D.; Assenmacher, W.; Mader, W.; Kroschel, M.; Jansen, M. · Journal of Materials Research · 1999

Electronic and Structural Characterization of the Near Surface Layer and the Bulk in νc-Si:H Prepared with Hydrogen dilutionAljishi, Samer; Jin, Shu; Stutzmann, Martin; Ley, Lothar · MRS Proceedings · 1989

SPIE Proceedings [SPIE 1984 Los Angeles Techincal Symposium - Los Angeles (Tuesday 24 January 1984)] Advanced Semiconductor Processing/Characterization of Electronic/Optical Materials - <title>Oxidation Of Singular And Vicinal Surfaces Of Silicon: The Structure Of Si-Si0<formula><inf><roman>2</roman></inf></formula> Interface</title>Mazur, J. H.; Gronsky, R.; Washburn, J.; Lampert, Carl M.; Sadana, Devindra K. · 1984

Synthesis, characterization, and solid-state structures of the 14-electron open metallocenes M[1,5-(Me3Si)2C5H5]2 (M= Ti or Zr)Robert W. Gedridge; Atta M. Arif; Richard D. Ernst · 1995

Electrical characterization of Al-SiO2-Si (N-type) tunnel structures, influence of LPCVD and LPO2 oxide growth technologies on the properties of the Si-SiO2 interface: G. Pananakakis, G. Kamarinos and M. El-sayed. Solid-St. Electron.26 (5), 415 (1983)1984