![[IEEE 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Osaka, Japan (2013.3.25-2013.3.28)] 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) - On the length of THRU standard for TRL de-embedding on Si substrate above 110 GHz]()
[IEEE 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Osaka, Japan (2013.3.25-2013.3.28)] 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) - On the length of THRU standard for TRL de-embedding on Si substrate above 110 GHzOrii, A.; Suizu, M.; Amakawa, S.; Katayama, K.; Takano, K.; Motoyoshi, M.; Yoshida, T.; Fujishima, M. · 2013